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Understanding metric-related pitfalls in image analysis validation
Annika Reinke
,
Minu D. Tizabi
,
Michael Baumgartner
,
Matthias Eisenmann
,
Doreen Heckmann-Nötzel
,
A. Emre Kavur
,
Tim Rädsch
,
Carole H. Sudre
,
Laura Acion
,
Michela Antonelli
,
Tal Arbel
,
Spyridon Bakas
,
Arriel Benis
,
Florian Buettner
,
M. Jorge Cardoso
,
Veronika Cheplygina
,
Jianxu Chen
,
Evangelia Christodoulou
,
Beth A. Cimini
,
Keyvan Farahani
,
Luciana Ferrer
,
Adrian Galdran
,
Bram van Ginneken
,
Ben Glocker
,
Patrick Godau
,
Daniel A. Hashimoto
,
Michael M. Hoffman
,
Merel Huisman
,
Fabian Isensee
,
Pierre Jannin
,
Charles E. Kahn
,
Dagmar Kainmueller
,
Bernhard Kainz
,
Alexandros Karargyris
,
Jens Kleesiek
,
Florian Kofler
,
Thijs Kooi
,
Annette Kopp-Schneider
,
Michal Kozubek
,
Anna Kreshuk
,
Tahsin Kurc
,
Bennett A. Landman
,
Geert Litjens
,
Amin Madani
,
Klaus Maier-Hein
,
Anne L. Martel
,
Erik Meijering
,
Björn Menze
,
Karel G. M. Moons
,
Henning Müller
,
Brennan Nichyporuk
,
Felix Nickel
,
Jens Petersen
,
Susanne M. Rafelski
,
Nasir Rajpoot
,
Mauricio Reyes
,
Michael A. Riegler
,
Nicola Rieke
,
Julio Saez-Rodriguez
,
Clara I. Sánchez
,
Shravya Shetty
,
Ronald M. Summers
,
Abdel A. Taha
,
Aleksei Tiulpin
,
Sotirios A. Tsaftaris
,
Ben Van Calster
,
Gaël Varoquaux
,
Ziv R. Yaniv
,
Paul F. Jäger
,
Lena Maier-Hein
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